SKG Test Fixture Quick Reference Guide

SKG Automation

by 홍스블루스 2024. 11. 18. 11:15

Model #	Previous Model #	Function	Description	Chip Size Range	Temperature Range	Frequency Range	Primary Application	Applicable Instruments
Test Tweezers
351	351	C/DF	short format, 2 standard electrodes per contact, 0.015" thick	0402 - 1812	0 - 55°C	up to 110 MHz	General purpuse testing of MLCC"s for C/DF	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
352	352	C/DF	long format, 2 standard electrodes per contact, 0.015" thick, angled mounting block	0402 - 4044	0 - 55°C	up to 110 MHz	General purpose testing of large MLCC,s for C/DF	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
353	353	C/DF	short format, 1 micro electrode per contact, 0.015" thick	01005 - 1812	0 - 55°C	up to 110 MHz	General purpose testing of small MLCC's, down to 01005	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
3504	354A	ACR	Kelvin Tweezers, short format, 2 standard electrodes per contact, 0.015" thick, Kelvin insulator	0805 - 1812	0 - 55°C	1 KHz	Testing milli-ohm resistance of chip inductors, inductor beads, etc.	4338B
3505	356	ACR	Kelvin Tweezers, short format, 2 micro electrodes per contact, 0.008" thick, Kelvin insulator	0402 - 1812	0-55°C	1 KHz	Testing milli-ohm resistance of chip inductors, inductor beads, etc.	4338B
3506	354B	DCR	Kelvin Tweezers, short format, 2 standard electrodes per contact, 0.015" thick, Kelvin insulator	0805 - 1812	0 - 55°C	DC	DCR testng of chip resistors, chip fuses, chip inductors and other chip devices	3458A, 34401A, 34460A, 34461A, 34465A, 34470A, other DCR meters, DC milli-ohm meters and DC micro-ohm meters utilizing banana connectors
3507	none	100 KHZ ESR	Kelvin tweezers, short format, 4 sharp pointed electrodes per contact (redundant Kelvin), 0.008" thick, Kelvin spacers 0.008" thick	All Tantalum surface mount case sizes	0 - 55°C	100KHz	100 KHz ESR testing of Tantalum chip capacitors that are mounted on a circuit board	4263B, other meters capable of 100 KHz ESR testing
3508	357	C/DF	short format, replaceable needle tip electrodes	0402 to 1812	0 - 55°C	up to 110 MHz	C/DF testing of chips in a tape/reel pack, also for testing discoidal capacitors and linear capacitor arrays	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
3509	358	C/DF	long format, replaceable needle tip electrodes, angled mounted block	0402 to 4440	0 - 55°C	up to 110 MHz	C/DF testing of chips in a tape/reel pack, can also be equipped for testing chips with 2 terminations on one surface of a chip	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
3510	361A	IR	short format, 2 standard electrodes per contact, connectors for 4349A/B	0402 to 1812	0 - 55°C	DC	IR testing of MLCC, 1000V max.	4339A/B
3511	361B	IR	short format, 2 standard electrodes per contact, banana connectors	0402 to 1812	0 - 55°C	DC	IR testing of MLCC, 1000V max.	GR 1864, GR 1685, HP 4329A, Beckman L7, Beckman L8
3512	362A	IR	long format, 2 compliant standard electrodes per contact, connectors for 4339A/B	0402 to 4440	0 - 55°C	DC	IR testing of MLCC, 1000V max.	4339A, 4339B
3514	363	IR	short format, 1 micro electrode per contact, 0.015" thick, banana connectors	01005 to 1812	0 - 55°C	DC	IR testing of MLCC, 1000V max.	GR 1864, GR 1685, HP 4329A, Beckman L7, Beckman L8
3515	363A	IR	short format, 1 micro electrode per contact, 0.015" thick, connectors for 4339A/B	01005 to 1812	0 - 55°C	DC	IR testing of MLCC, 1000V max.	4339A, 4339B
3516	361C	IR	short format, 2 standard electrodes per contact, 0.015" thick, connectors for B2985A, B2987A	0402 to 1812	0 - 55°C	DC	IR testing of MLCC, 1000V max.	B2985A, B2987A
3517	364	IR	short format, 1 micro electrode per contact, connectors for B2985A, B2987A	01005 to 1812	0 - 55°C	DC	IR testing of MLCC, 1000V max.	B2985A, B2987A
3525	none	C/DF	long format, wide mounting block, 4 compliant electrodes per contact, used for very large chips	very large chips, mostly used for stacks	0 - 55°C	up to 110 MHz	General purpose testing of large MLCC,s for C/DF	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
3527	354	DCR	Kelvin Tweezers, long format, 2 standard electrodes per contact, 0.015" thick, Kelvin insulator	0603 - 4440	0 - 55°C	DC	DCR testng of chip resistors, chip fuses, chip inductors and other chip devices	3458A, 34401A, 34460A, 34461A, 34465A, 34470A, other DCR meters, DC milli-ohm meters and DC micro-ohm meters utilizing banana connectors
3528	355	DCR	Kelvin Tweezers, long format, 2 micro electrodes per contact, 0.008" thick, Kelvin insulators. Shrouded banana connectorts	0603 - 4440	0 - 55°C	DC	DCR testng of chip resistors, chip fuses, chip inductors and other chip devices	3458A, 34401A, 34460A, 34461A, 34465A, 34470A, other DCR meters, DC milli-ohm meters and DC micro-ohm meters utilizing shrouded banana connectors
3529	none	DWV	long format, angled mounting block, no cladding on legs, 2 electrodes per contact, needle tip electrodes with no diameter reduction	DWV on large DUT's	0 - 55°C	DC	DWV testing of chip DUT's	Vitrek DWV meters
3531	none	IR	long format, wide mounting block, 4 compliant electrodes per contact, used for very large chips	very large chips, mostly used for stacks	0 - 55°C	IR	IR testing of large MLCC	4339A, 4339B
3532	none	IR	long format, needle electrodes, angled mounting block	0201 to 4440	0 - 55°C	IR	IR testing of MLCC	4339A, 4339B
3533	none	IR	long format, wide mounting block, 4 electrodes per contact, used for very large chips	very large chips, mostly used for stacks	0 - 55°C	IR	IR testing of large MLCC	B2985A, B2987A
3534	none	IR	long format, needle electrodes, angled mounting block	0201 to 4440	0 - 55°C	IR	IR testing of MLCC	B2985A, B2987A
3535	none	ACR	long format, two standard Kelvin electrodes per contact, BNC connectors	0603 - 4440	0 - 55°C	ACR	Testing milli-ohm resistance of chip inductors, inductor beads, etc.	4338B
3536	none	IR	long format, two standard electrodes per contact, slanted end block, banana connectors	0603 to 4440	0 - 55°C	IR	IR testing of MLCC	GR 1864, GR 1865, HP 4329A, Beckman L7, Beckman L8
3537	none	IR	short format, needle electrodes	01005 to 1206	0 - 55°C	IR	IR testing of MLCC chips	4339A, 4339B
3538	none	C/DF	short format, needle electrodes	01005 to 1206	0 - 55°C	C/DF	C/DF testing of MLCC chips	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
3539	none	IR	short format, needle electrodes	01005 to 1206	0 - 55°C	IR	IR testing of MLCC chips	GR 1864, GR 1865, HP 4329A, Beckman L7, Beckman L8
Self Closing Test Tweezers
3519	381	C/DF	self retaining tweezers with cabeling	0402 to 4440 MLCC's, all Tantalum case sizes	-55°C - 125°C	up to 110 MHz	temperature testing of MLCC's, Tantalum chips and other chip components	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
3520	382	IR	self retaining tweezers with cabeling	0402 to 4440 MLCC's, all Tantalum case sizes	-55°C - 125°C	DC	temperature testing of MLCC's, Tantalum chips and other chip components	4339A, 4339B
3521	383	IR	self retaining tweezers with cabeling	0402 to 4440 MLCC's, all Tantalum case sizes	-55°C - 125°C	DC	temperature testing of MLCC's, Tantalum chips and other chip components	B2985A, B2987A
3522	384	DCR	self retaining tweezers with cabeling	0402 to 4440 MLCC's, all Tantalum case sizes	-55°C - 125°C	DC	temperature testing of MLCC's, Tantalum chips and other chip components	3458A, 34401A, 34460A, 34461A, 34465A, 34470A, other DCR meters, DC milli-ohm meters and DC micro-ohm meters utilizing banana connectors
3523	none	ACR	self retaining tweezers with cabeling	0402 to 4440 MLCC's, all Tantalum case sizes	-55°C - 125°C	1 KHz	temperature testing of MLCC's, Tantalum chips, chip inductors, inductor beads and other chip components	4338B
3524	none	100 KHZ ESR	self retaining tweezers with cabeling, redundent Kelvin contacts	0402 to 4440 MLCC's, all Tantalum case sizes	-55°C - 125°C	100 KHz	100 KHz ESR testing of Tantalum chip capacitors, MLCC's and other chip componentss	4263B, other meters capable of 100 KHz ESR testing
3526	none	100 KHZ ESR	self retaining tweezers with cabeling, redundent Kelvin contacts	0402 to 4440 MLCC's, all Tantalum case sizes	-55°C - 165°C	100 KHz	100 KHz ESR testing of Tantalum chip capacitors, MLCC's and other chip componentss	4263B, other meters capable of 100 KHz ESR testing
3530	none	DCR	self retaining tweezers with cabeling	0402 to 4440 MLCC's, all Tantalum case sizes	-55°C - 125°C	DC	IR testing of MLCC, 1000V max.	GR 1864, GR 1685, HP 4329A, Beckman L7, Beckman L8
SLC test sets
3600	none	C/DF	SLC test set, includes hand held probe and base electrode, cabeling	All SLC chip sizes	0 - 55°C	1 KHz to 1 MHz	C/DF testing of SLC's	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
3600BE	none	C/DF	replacement base electrode for 3600	All SLC chip sizes	0 - 55°C		C/DF testing of SLC's	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
3601	none	IR	SLC test set, includes hand held probe and base electrode, cabeling	All SLC chip sizes	0 - 55°C	DC	IR testing of SLC's	4339A, 4339B
3601BE	none	C/DF	replacement base electrode for 3601	All SLC chip sizes		DC	C/DF testing of SLC's	4339A, 4339B
3602	none	IR	SLC test set, includes hand held probe and base electrode, cabeling	All SLC chip sizes	0 - 55°C	DC	IR testing of SLC's	B2985A, B2987A
3602BE	none	C/DF	replacement base electrode for 3602	All SLC chip sizes	0 - 55°C	DC	C/DF testing of SLC's	B2985A, B2987A
3603	none	IR	SLC test set, includes hand held probe and base electrode, cabeling	All SLC chip sizes	0 - 55°C	DC	IR testing of SLC's	IR meters equipped with banana connectors, including IET1864, IET 1865,
3603BE	none	IR	replacement base electrode for 3603	All SLC chip sizes	0 - 55°C	DC	C/DF testing of SLC's	IR meters equipped with banana connectors, including IET1864, IET 1865,
3604	none	IR	SLC test set, includes hand held probe and base electrode, cabeling	All SLC chip sizes	0 - 55°C	DC	IR meters equipped with banana connectors, including IET1864, IET 1865,	IR meters equipped with banana and BNC connectors, including HP 43429A
3604BE	none	IR	replacement base electrode for 3604	All SLC chip sizes	0 - 55°C	1 KHz to 1 MHz	C/DF testing of SLC's	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
3605	none	ALL	Probe stand for open and short compensation	All SLC chip sizes	0 - 55°C	DC	C/DF testing of SLC's	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
3607	none	C/DF	SLC test set for chips mounted on ceramic substrate	All SLC chip sizes	0 - 55°C	1 KHz to 1 MHz	C/DF testing of SLC's	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
3608	none	IR	SLC test set for chips mounted on ceramic substrate	All SLC chip sizes	0 - 55°C	DC	IR testing of SLC's	IR meters equipped with banana connectors, including IET1864, IET 1865,
3608BE	none	IR	replacement base electrode for 3608	All SLC chip sizes	0 - 55°C	DC	IR testing of SLC's	IR meters equipped with banana connectors, including IET1864, IET 1865,
3609	none	C/DF	Precision SLC pivot test set	All Gap Cap style chip sizes	0 - 55°C	1 KHz to 1 MHz	C/DF testing of Gap Cap style chips	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
3610	none	IR	Precision SLC pivot test set	All Gap Cap style chip sizes	0 - 55°C	DC	IR testing of Gap Cap style chips	B2985A, B2987A
3611	none	IR	Precision SLC pivot test set	All Gap Cap style chip sizes	0 - 55°C	DC	IR testing of Gap Cap style chips	4339A/B
3612	none	C/DF	Precision SLC test set	All SLC chip sizes	0 - 55°C	1 KHz to 1 MHz	C/DF testing of SLC chips	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
3613	none	C/DF	Precision SLC test set with compliant contact	All SLC chip sizes	0 - 55°C	1 KHz to 1 MHz	C/DF testing of SLC chips	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
3614	none	IR	Precision SLC test set with compliant contact	All SLC chip sizes	0 - 55°C	DC	IR testing of SLC chips	4339A/B
3615	none	IR	Precision SLC test set with compliant contact	All SLC chip sizes	0 - 55°C	DC	IR testing of SLC chips	B2985A, B2987A
Hand held probes
3606	none	Kelvin DCR	hand held probe, two can be used to probe components, circuit boards, etc	All chip sizes, plus circuit boards, etc.	0 - 55°C	DC	DCR testing of components and other devices	3458A, 34401A, 34460A, 34461A, 34465A, 34470A, other DCR meters, DC milli-ohm meters and DC micro-ohm meters utilizing banana connectors
Instrument Mounted Fixtures
5720	572	C/DF	instrument mounted fixture for testing MLCC	01005 to 4044	0 - 55°C	up to 40 MHz	C/DF testing of MLCC	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
5740	574	C/DF	instrument mounted fixture for testing axial and radial leaded capacitors	Radial and Axial leaded components up to 2" long,	0 - 55°C	up to 40 MHz	C/DF testing of leaded components	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
5741	none	ACR, 100 KHZ ESR	instrument mounted fixture for testing axial and radial leaded capacitors	Radial and Axial leaded components up to 2" long,	0 - 55°C	up to 100 KHz	AC resistance (4338A/B) of axial or radial leaded components	4263B, E4980A, E4981A, 4275A, 4338B
5702	573	C/DF	instrument mounted fixture for testing MLCC, modular design with replaceable contacts	0201 up to 1812	0 - 55°C	up to 110 MHz	Efficient low volume production testing of MLCC	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
Bench Fixtures
5742	550	DCR	Bench fixture with modular Kelvin contacts, 2 adjustable axis and banana connectors	0402 up to 1812	0 - 55°C	DC	DCR of chip components	3458A, 34401A, 34460A, 34461A, 34465A, 34470A, other DCR meters, DC milli-ohm meters and DC micro-ohm meters utilizing banana connectors
5743	none	IR	IR testing of leaded capacitors, equipped with connectors that mate with 4339AB meters, includes interlock connector. Mounted inside a shielded metal box for operaotr safety. Two axis.	Radial and Axial leaded components up to 2" long,	0 - 55°C	DC	Insulation resistance of leaded capacitors and other components	4339A / B
5744	none	IR	IR testing of leaded capacitors, equipped with connectors that mate with B2985A and B2987A meters, includes interlock connector. Mounted inside a shielded metal box for operaotr safety. Two axis	Radial and Axial leaded components up to 2" long,	0 - 55°C	DC	Insulation resistance of leaded capacitors and other components	B2985A, B2987A
5745	none	IR	IR testing of leaded capacitors, equipped with connectors that mate with IET 1865 meters, includes interlock connector. Mounted inside a shielded metal box for operaotr safety.	Radial and Axial leaded components up to 2" long,	0 - 55°C	DC	Insulation resistance of leaded capacitors and other components	IET 1865
5746	none	IR	IR testing of leaded capacitors, equipped with connectors that mate with IET 1864 meters. Mounted inside a shielded metal box for operaotr safety.	Radial and Axial leaded components up to 2" long,	0 - 55°C	DC	Insulation resistance of leaded capacitors and other components	IET 1864
5747	570	C/DF	Bench fixture, 2 adjustable axis, modular contact and quick disconnect	MLCC 01005 to 4440	0 - 55°C	50 Hz to 1 MHz	C/DF testing of MLCC	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
5748			not assigned
5749	560A	IR	Bench fixture with two adjustable axis, shielded box, interlock switch, connectors for Agilent 4339A/B	0201 to large	0 - 55°C	DC	IR testing of chip components	Agilent 4339A / B
5750	560B	IR	Bench fixture with two adjustable axis, shielded box, interlock switch, banana connectors	0201 to large	0 - 55°C	DC	IR testing of chip components	IET 1685, 1685+
5751	560C	IR	Bench fixture with two adjustable axis, shielded box, interlock switch, connectors for B2985A, B2087A	0201 to large	0 - 55°C	DC	IR testing of chip components	Keysight B2985A, B2987A
5752	571, MTF	C/DF	Bench fixture, 3 adjustable axis, modular contact and quick disconnect	MLCC 01005 to 4440	0 - 55°C	50 Hz to 1 MHz	C/DF testing of MLCC	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
5753	none	C/DF	Bench fixture, 3 adjustable axis, modular contact, quick disconnect	0201 to large	0 - 55°C	50 Hz to 1 MHz	C/DF testing of chip components	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
5754	none	Kelvin DCR	Bench fixture, 3 adjustable axis, modular contact and quick disconnect, banana connectors	0201 to large	0 - 55°C	DC to 1MHZ	Kelvin DCR testing chip components	3458A, 34401A, 34460A, 34461A, 34465A, 34470A, other DCR meters, DC milli-ohm meters and DC micro-ohm meters utilizing banana connectors
5755	none	IR	Bench fixture, 3 adjustable axis, modular contacts and quick disconnect, shielded box and interlock switch	0201 to large	0 - 55°C	50 Hz to 1 MHz	IR testing of chip components	Agilent 4339A / B
5756	none	IR	Bench fixture, 3 adjustable axis, modular contacts and quick disconnect, shielded box and interlock switch	0201 to large	0 - 55°C	DC	IR testing of chip components	Keysight B2985A, B2987A
5757	none	IR	Bench fixture, 3 adjustable axis, modular contacts and quick disconnect, shielded box and interlock switch	0201 to large	0 - 55°C	DC	IR testing of chip components	IET 1865
5758			not assigned
5759	none	C/DF	Pivot Fixture, three adjustable axis	All Gap Cap type chips	0 - 55°C	1Khz to 1MHz	C/DF testing of Gap Cap chips and other DUT's with two or more terminations on one surface	4278A, 4263, 4268, 4288, E4980A, E4981A, E4980AL, 4284A, 4285A, 4294A
5760	none	IR	Pivot Fixture, three adjustable axis	All Gap Cap type chips	0 - 55°C	DC	IR testing of Gap Cap chips and other DUT's with two or more terminations on one surface	B2985A, B2987A
5761	none	IR	Pivot Fixture, three adjustable axis	All Gap Cap type chips	0 - 55°C	DC	IR testing of Gap Cap chips and other DUT's with two or more terminations on one surface	4339A / B
5762	none	DCR	Pivot Fixture, three adjustable axis	All SMD sizes	0 - 55°C	DC	DCR testing of chip resistors and other DUT's with two terminations on one surface	3458A, 34401A, 34460A, 34461A, 34465A, 34470A, other DCR meters, DC milli-ohm meters and DC micro-ohm meters utilizing banana connectors
5763	550A	ACR	Bench fixture with three adjustable axis, BNC connectors, modular Kelvin contacts	0201 to large	0 - 55°C	50HZ to 100KHZ	Kelvin ACR testing chip components	4338A, 4263B
Hand Held IR Fixtures
4339-110	4339-110	IR	Low noise test leads	All SMD sizes, other DUT's	0 - 55°C	dc	IR testing of SMD chips and and other DUT's	4339A / B
2985-100	2985-100	IR	Low noise test leads	All SMD sizes, other DUT's	0 - 55°C	DC	IR testing of SMD chips and and other DUT's	B2985A, B2987A
option 001	option 001	IR	Red and black hand held probes	All SMD sizes, other DUT's	0 - 55°C	DC	IR testing of SMD chips and and other DUT's	4339A / B, B2985A, B2987A
option 002	option 002	IR	Red and black bulkhead jacks	All SMD sizes, other DUT's	0 - 55°C	DC	IR testing of SMD chips and and other DUT's	4339A / B, B2985A, B2987A
option 003	option 003	IR	Red and black large alligator clips	All SMD sizes, other DUT's	0 - 55°C	DC	IR testing of SMD chips and and other DUT's	4339A / B, B2985A, B2987A
Insulation Resistance Standards
1A 1M	1A 1M	IR	1 mega ohm 1% resistance standard	NA	22 C	DC	verify meter calibration	4339A/B, B2985A, B2987A
1A 10M	1A 10M	IR	10 mega ohm 1% resistance standard	NA	22 C	DC	verify meter calibration	4339A/B, B2985A, B2987A
1A 100M	1A 100M	IR	100 mega ohm 1% resistance standard	NA	22 C	DC	verify meter calibration	4339A/B, B2985A, B2987A
1A 1G	1A 1G	IR	1 giga ohm 1% resistance standard	NA	22 C	DC	verify meter calibration	4339A/B, B2985A, B2987A
1A 10G	1A 10G	IR	10 giga ohm 1% resistance standare	NA	22 C	DC	verify meter calibration	4339A/B, B2985A, B2987A
1A 100G	1A 100G	IR	100 giga ohm 2% resistance standard	NA	22 C	DC	verify meter calibration	4339A/B, B2985A, B2987A
1A 1T	1A 1T	IR	1 tera ohm 5% resistance standard	NA	22C	DC	verify meter calibration	4339A/B, B2985A, B2987A
4339-111	4339-111	IR	cable set to mate 1A resistance standards to 4339A/B	NA	22C	DC	verify meter calibration	4339A/B
2985-100	2985-100	IR	cable set to mate 1A resistance standards to B2985A, B2987A	NA	22C	DC	verify meter calibration	B2985A, B2987A
4349-100	none	IR	cable to mate 1A resistance standards to Agilent 4349 meters	NA	22C	DC	verify meter calibration	4349A, 4349B